HAST chambers
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HAST – Highly Accelerated Stress Chambers are designed for testing electronic and electrotechnical components in conditions of high temperature, high humidity and high pressure. This type of exposure is used for quickly detecting potential weak points in subassemblies, eg printed circuit boards with mounted components.
Features
- Volume of test chamber 18, 2×18, 46 i 2×46 litres,
- Temperature control range from +105 to 162 °C,
- Humidity control range from 75 to 100 %RH,
- Pressure control from 0,39 MPa.
Standards
EN 60068-2-66 :1999 Environmental testing. Test methods. Test Cx. Damp heat, steady state (unsaturated pressurized vapour)
EN 60749-4:2004 Semiconductor devices. Mechanical and climatic test methods. Damp heat, steady state, highly accelerated stress test (HAST)
EN 60749-24:2006 Semiconductor devices – Mechanical and climatic test methods – Part 24: Accelerated moisture resistance – Unbiased HAST